• DocumentCode
    2324598
  • Title

    Final focusing of Z-discharge transported ion beams

  • Author

    Neri, J.M. ; Boller, J.R. ; Cooperstein, G. ; Goodrich, P.J. ; Hinshelwood, D.D. ; Mosher, D. ; Ottinger, P.F. ; Scherrer ; Stephanakis, S.J. ; Watrous, J.J. ; Young, Frederic

  • Author_Institution
    US Naval Res. Lab., Washington, DC, USA
  • fYear
    1989
  • fDate
    0-0 1989
  • Firstpage
    89
  • Abstract
    Summary Form only given, as follows. An experimental program is underway at NRL to demonstrate final focusing of transported ion beams. Z-discharge channels are used to transport ion beams efficiently from the ion source to an ICF target, providing isolation and distance for time-of-flight power compression. Channel stability and beam energy loss constraints force a minimum channel diameter for a given ion beam power. Final focusing uses an additional short Z-discharge with larger current to reduce the spot size of the ion beam from the channel diameter to the target diameter. The Gamble II accelerator is used to produce a proton beam from a pinched-reflex diode. The effect of the final focus is measured with a shadowbox at the exit of the final focus cell, and the transport is measured by the /sup 19/F(p, alpha gamma ) reaction from 50% transparent Teflon screens placed in the channel. Analysis of the shadowbox damage patterns indicates that the final focus cell plasma is taken into account. The 2.54-cm-diameter ion beam from the channel is reduced in diameter to less than 1.4 cm.<>
  • Keywords
    discharges (electric); ion beams; /sup 19/F(p, alpha gamma ) reaction; Gamble II accelerator; ICF target; Teflon screens; Z-discharge transported ion beams; channel diameter; channel stability; channels; damage patterns; distance; final focusing; ion source; isolation; pinched-reflex diode; proton beam; shadowbox; time-of-flight power compression; Gas discharges; Ion beams;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1989. IEEE Conference Record - Abstracts., 1989 IEEE International Conference on
  • Conference_Location
    Buffalo, NY, USA
  • Type

    conf

  • DOI
    10.1109/PLASMA.1989.166094
  • Filename
    166094