System level policies for fault tolerance issues in the FERMI project

Author

Acqua, A. Dell´ ; Hansen, M. ; Ikinen, S. ; Lofstedt, B. ; Vanuxem, J.P. ; Svensson, C. ; Yuan, J. ; Hentzell, H. ; Buono, L. ; David, J. ; Genat, J.F. ; Lebbolo, H. ; LeDortz, O. ; Nayman, P. ; Savoy-Navarro, A. ; Zitoun, R. ; Alippi, C. ; Breveglieri, L

Author_Institution

CERN, Geneva, Switzerland

fYear

1993

fDate

27-29 Oct 1993

Firstpage

1

Lastpage

8

Abstract

The FERMI system, performing acquisition and DSP of calorimeter data in high energy collision experiments, planned at the LHC collider (CERN, Geneva, CH) is briefly overviewed. The system relies mainly upon the FERMI module, a dedicated VLSI multichip device performing most of the above functions, which is to be installed in large quantities (around 10⁵) in the immediate neighborhood of the collider itself, requiring rad-hard features. The issues for a system which absolutely requires fault diagnosis and possibly fault tolerance are described, with regard to the FERMI module itself

Keywords

digital signal processing chips; CERN; FERMI project; LHC collider; calorimeter data; dedicated VLSI multichip device; fault diagnosis; fault tolerance; high energy collision experiments; redundancy; testing; Digital signal processing; Fault diagnosis; Fault tolerant systems; Ionizing radiation; Large Hadron Collider; Materials science and technology; Microelectronics; Physics; Radiation hardening; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on

Conference_Location

Venice

ISSN

1550-5774

Print_ISBN

0-8186-3502-9

Type

conf

DOI

10.1109/DFTVS.1993.595597

Filename

595597