• DocumentCode
    2324821
  • Title

    System level evaluation of TDD based LTE-Advanced MIMO-OFDMA systems

  • Author

    Pennanen, Harri ; Haataja, Tuomas ; Leinonen, Jouko ; Tölli, Antti ; Latva-aho, Matti

  • Author_Institution
    Centre for Wireless Commun., Univ. of Oulu, Oulu, Finland
  • fYear
    2010
  • fDate
    6-10 Dec. 2010
  • Firstpage
    809
  • Lastpage
    813
  • Abstract
    This paper presents system level downlink performance evaluation results for the TDD based LTE-Advanced networks utilizing some of the most recent technologies for mobile systems. The main enhanced technology components used in the systems include multi-user (MU)-MIMO, intra-site coordinated multipoint (CoMP) transmission and space-time-frequency proportional fair scheduling. Performance comparison between single-user (SU)-MIMO, MU-MIMO and MU-MIMO with intra-site CoMP OFDMA systems is presented. System level results show that MU-MIMO and MU-MIMO with intra-site CoMP systems exceed the downlink cell average and cell edge user throughput requirements of the IMT-Advanced systems set by ITU-R in urban micro ITU environment. Furthermore, it is shown that MU-MIMO system with intra-site CoMP outperforms uncoordinated MU-MIMO system in terms of throughput. Hence, intra-site CoMP can be considered as a key technique to further improve the throughput performance of LTE-Advanced.
  • Keywords
    Long Term Evolution; MIMO communication; OFDM modulation; cellular radio; frequency division multiple access; radio links; scheduling; CoMP transmission; IMT-advanced system; MIMO-OFDMA system; MU-MIMO system; TDD based LTE-advanced network; cell edge user throughput; downlink cell average; intra-site CoMP OFDMA system; intra-site coordinated multipoint; mobile system; multiuser MIMO; single-user MIMO; space-time-frequency proportional fair scheduling; system level downlink performance evaluation; urban micro ITU environment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    GLOBECOM Workshops (GC Wkshps), 2010 IEEE
  • Conference_Location
    Miami, FL
  • Print_ISBN
    978-1-4244-8863-6
  • Type

    conf

  • DOI
    10.1109/GLOCOMW.2010.5700436
  • Filename
    5700436