Title : 
SSTA considering switching process induced correlations
         
        
            Author : 
Wu, Zeqin ; Maurine, Philippe ; Azemard, Nadine ; Ducharme, Gille
         
        
            Author_Institution : 
LIRMM, Univ. of Montpellier II, Montpellier
         
        
        
            fDate : 
Nov. 30 2008-Dec. 3 2008
         
        
        
        
            Abstract : 
Statistical static timing analysis (SSTA) is becoming complicated due to introduction of more and more advanced statistical techniques. In this paper, with the help of conditional moments, we propose a simple path-based timing approach, which permits us to consider gate topology and switching process induced correlations. Numerical results are presented to quantify the relative impact of these two factors on estimation accuracy of path delay distribution.
         
        
            Keywords : 
correlation methods; estimation theory; statistical analysis; SSTA; conditional moments; consider gate topology; estimation accuracy; path based timing approach; path delay distribution; statistical static timing analysis; switching process induced correlations; Delay estimation; Fourier series; Gaussian processes; Principal component analysis; Probability; Random variables; Statistical analysis; Threshold voltage; Timing; Topology;
         
        
        
        
            Conference_Titel : 
Circuits and Systems, 2008. APCCAS 2008. IEEE Asia Pacific Conference on
         
        
            Conference_Location : 
Macao
         
        
            Print_ISBN : 
978-1-4244-2341-5
         
        
            Electronic_ISBN : 
978-1-4244-2342-2
         
        
        
            DOI : 
10.1109/APCCAS.2008.4746085