DocumentCode :
2324877
Title :
SSTA considering switching process induced correlations
Author :
Wu, Zeqin ; Maurine, Philippe ; Azemard, Nadine ; Ducharme, Gille
Author_Institution :
LIRMM, Univ. of Montpellier II, Montpellier
fYear :
2008
fDate :
Nov. 30 2008-Dec. 3 2008
Firstpage :
562
Lastpage :
565
Abstract :
Statistical static timing analysis (SSTA) is becoming complicated due to introduction of more and more advanced statistical techniques. In this paper, with the help of conditional moments, we propose a simple path-based timing approach, which permits us to consider gate topology and switching process induced correlations. Numerical results are presented to quantify the relative impact of these two factors on estimation accuracy of path delay distribution.
Keywords :
correlation methods; estimation theory; statistical analysis; SSTA; conditional moments; consider gate topology; estimation accuracy; path based timing approach; path delay distribution; statistical static timing analysis; switching process induced correlations; Delay estimation; Fourier series; Gaussian processes; Principal component analysis; Probability; Random variables; Statistical analysis; Threshold voltage; Timing; Topology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2008. APCCAS 2008. IEEE Asia Pacific Conference on
Conference_Location :
Macao
Print_ISBN :
978-1-4244-2341-5
Electronic_ISBN :
978-1-4244-2342-2
Type :
conf
DOI :
10.1109/APCCAS.2008.4746085
Filename :
4746085
Link To Document :
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