DocumentCode
2324927
Title
Computation of scale-independent surface roughness via the generation of multiscale digital elevation models
Author
Sathyamoorthy, Dinesh ; Hani, Ahmad Fadzil Mohamad ; Asirvadam, Vijanth Sagayan
Author_Institution
Sci. & Technol. Res. Inst. for Defence (STRIDE), Minist. of Defence, Kuala Lumpur
fYear
2008
fDate
13-15 May 2008
Firstpage
756
Lastpage
759
Abstract
The quantitative computation of surface roughness has received increasing attention due to its importance in numerical surface study. A number of algorithms have been employed to compute surface roughness. These algorithms, which operate at singular scales of measurement, provide scale-dependant roughness parameters. In this paper, the computation of a scale-independent roughness parameter is performed via the generation of multiscale digital elevation models (DEMs).The proposed procedure employs the lifting scheme to generate multiscale DEMs. Using the mask of pixels modified at each scale, granulometric analysis is employed to compute the average size of convex and concave regions in the DEM, and the scale-independent average roughness of the terrain of the DEM due the distribution of convex and concave regions in the terrain. The proposed procedure provides a surface roughness parameter that is realistic with respect to the amplitudes and frequencies of the terrain, invariant with respect to rotation and translation, and has intuitive meaning.
Keywords
geophysics computing; surface roughness; convex distribution; lifting scheme; multiscale digital elevation models; roughness parameter; scale-independent surface roughness; Digital elevation models; Distributed computing; Frequency measurement; Level measurement; Rotation measurement; Rough surfaces; Surface fitting; Surface roughness; Terrain mapping; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer and Communication Engineering, 2008. ICCCE 2008. International Conference on
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4244-1691-2
Electronic_ISBN
978-1-4244-1692-9
Type
conf
DOI
10.1109/ICCCE.2008.4580706
Filename
4580706
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