Title :
Electron collisions with processing plasma constituents
Author_Institution :
Dept. of Phys., City Coll., City Univ. of New York, NY, USA
Abstract :
Summary Form only given, as follows. The author is studying the electron-impact dissociation of NF/sub 3/, CF/sub 4/, SF/sub 6/, BCl/sub 3/ and CCl/sub 2/F/sub 2/, which are among the most commonly employed reactive constituents of etchant gas plasmas. The objective is to determine absolute cross sections and appearance potentials for the formation of the various radiating, metastable, and neutral ground-state fragments that are produced by controlled electron-impact dissociation of these molecules. Experimental techniques include electron and optical emission spectroscopy, mass spectroscopy time-of-flight (TOF), and laser-induced fluorescence techniques. Results on molecular emissions in the near ultraviolet region of the optical spectrum are reported. These include the emission of the BCl A to X band system from BCl/sub 3/, the CCl A to X and CCl/sup +/ A to X band systems from CCl/sub 2/F/sub 2/, and continuous UV emissions following dissociative electron impact on SF/sub 6/ and NF/sub 3/.<>
Keywords :
electron spectra; mass spectra; molecular electron impact dissociation; molecular fluorescence; plasma collision processes; plasma diagnostics; time of flight spectra; A-X band system; BCl/sub 3/; NF/sub 3/; SF/sub 6/; absolute cross sections; appearance potentials; dichlorodifluoromethane; dissociative electron impact; electron spectroscopy; electron-impact dissociation; etchant gas plasmas; laser-induced fluorescence techniques; mass spectroscopy; metastable fragments; near ultraviolet region; neutral ground-state fragments; optical emission spectroscopy; processing plasma constituents; radiating fragments; reactive constituents; tetrafluoromethane; time of flight spectroscopy; Electron spectroscopy; Fluorescence; Mass spectroscopy; Particle collisions; Plasma measurements;
Conference_Titel :
Plasma Science, 1989. IEEE Conference Record - Abstracts., 1989 IEEE International Conference on
Conference_Location :
Buffalo, NY, USA
DOI :
10.1109/PLASMA.1989.166096