A new detecting algorithm for chip based on B-spline wavelet

Author

Mai, Qian ; Gao, Hongxia ; Hu, Yueming

Author_Institution

Eng. Res. Center for Precision Electron. Manuf. Equipments of Minist. of Educ., South China Univ. of Technol., Guangzhou, China

fYear

2010

fDate

10-12 April 2010

Firstpage

107

Lastpage

110

Abstract

Locating and detecting algorithm for chip is important in visual detection of electronic manufacturing process. Its performance directly affects the speed and accuracy of assembling chip on Printed Circuit Board. This paper analyzed the common algorithms´ disadvantages in locating accuracy. Then based on the above analysis, a new algorithm was proposed, in which B-spline is used to detect edge accurately and help to mount chip more precisely. Experiment results demonstrated that the proposed algorithm´s performance is better than SUSAN and Canny algorithms´ in locating accuracy and stability, and can meet the practical demand of mounting chip.

Keywords

edge detection; printed circuit manufacture; splines (mathematics); wavelet transforms; B-spline wavelet; Canny algorithm; SUSAN algorithm; detecting algorithm; electronic manufacturing process; locating accuracy; locating algorithm; printed circuit board; visual detection; Algorithm design and analysis; Assembly; Data mining; Educational technology; Electronic equipment manufacture; Image edge detection; Manufacturing automation; Manufacturing processes; Printed circuits; Spline;

fLanguage

English

Publisher

ieee

Conference_Titel

Networking, Sensing and Control (ICNSC), 2010 International Conference on

Conference_Location

Chicago, IL

Print_ISBN

978-1-4244-6450-0

Type

conf

DOI

10.1109/ICNSC.2010.5461529

Filename

5461529