Title :
A new detecting algorithm for chip based on B-spline wavelet
Author :
Mai, Qian ; Gao, Hongxia ; Hu, Yueming
Author_Institution :
Eng. Res. Center for Precision Electron. Manuf. Equipments of Minist. of Educ., South China Univ. of Technol., Guangzhou, China
Abstract :
Locating and detecting algorithm for chip is important in visual detection of electronic manufacturing process. Its performance directly affects the speed and accuracy of assembling chip on Printed Circuit Board. This paper analyzed the common algorithms´ disadvantages in locating accuracy. Then based on the above analysis, a new algorithm was proposed, in which B-spline is used to detect edge accurately and help to mount chip more precisely. Experiment results demonstrated that the proposed algorithm´s performance is better than SUSAN and Canny algorithms´ in locating accuracy and stability, and can meet the practical demand of mounting chip.
Keywords :
edge detection; printed circuit manufacture; splines (mathematics); wavelet transforms; B-spline wavelet; Canny algorithm; SUSAN algorithm; detecting algorithm; electronic manufacturing process; locating accuracy; locating algorithm; printed circuit board; visual detection; Algorithm design and analysis; Assembly; Data mining; Educational technology; Electronic equipment manufacture; Image edge detection; Manufacturing automation; Manufacturing processes; Printed circuits; Spline;
Conference_Titel :
Networking, Sensing and Control (ICNSC), 2010 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-6450-0
DOI :
10.1109/ICNSC.2010.5461529
