• DocumentCode
    2325187
  • Title

    Frequency calibration of THz time-domain spectrometers using an etalon

  • Author

    Naftaly, Mira ; Dudley, Richard A. ; Fletcher, John R.

  • Author_Institution
    Nat. Phys. Lab., Teddington, UK
  • fYear
    2009
  • fDate
    21-25 Sept. 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We present an etalon-based method of calibrating the frequency of THz time-domain spectrometers (TDS). The method utilizes the etalon effect produced by multiple reflections in non-absorbing wafers or in narrow air-gaps. The technique provides frequency calibration across the measurement band with uncertainties comparable with the typical THz TDS resolution.
  • Keywords
    calibration; electromagnetic wave interferometers; terahertz spectroscopy; etalon; frequency calibration; terahertz time domain spectrometer; Air gaps; Bandwidth; Calibration; Dynamic range; Frequency measurement; Optical reflection; Refractive index; Solids; Spectroscopy; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
  • Conference_Location
    Busan
  • Print_ISBN
    978-1-4244-5416-7
  • Electronic_ISBN
    978-1-4244-5417-4
  • Type

    conf

  • DOI
    10.1109/ICIMW.2009.5325539
  • Filename
    5325539
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2325187