• DocumentCode
    2325553
  • Title

    A meta level dynamic approach to visualize impact analysis for regression testing

  • Author

    Pourgalehdari, Omid ; Zamli, Kamal Z. ; Isa, Nor Ashidi Mat

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Univ. Sains Malaysia, Penang
  • fYear
    2008
  • fDate
    13-15 May 2008
  • Firstpage
    928
  • Lastpage
    931
  • Abstract
    Fixing software bugs, extending base applications with new functionalities, as well as adapting to changing environments are among the reasons for software evolution. To facilitate such a process and to help maintainers make informed decision, there is a need to be able to estimate and determine the impacts of evolution to the overall software system. While there are already quite a number of useful tools, termed impact analysis tools, developed either as research prototypes or commercial products that addresses such issues, much of which is static based and adopts traditional text based impact reporting. To address some of these issues, we propose a new change impact analysis, called JRegres, that can dynamically generate trails for impact analysis as well as support impact visualization. JRegres serves as a research vehicle to investigate the hypothesis that suggests impact visualization is useful for supporting regression testing.
  • Keywords
    program debugging; program diagnostics; program testing; program visualisation; software maintenance; software prototyping; JRegres impact analysis tool; impact visualization; meta level dynamic approach; regression testing; software bug fixing; software evolution; software maintenance; Application software; Computer bugs; Prototypes; Software debugging; Software prototyping; Software systems; Testing; Vehicle dynamics; Vehicles; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Communication Engineering, 2008. ICCCE 2008. International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-1691-2
  • Electronic_ISBN
    978-1-4244-1692-9
  • Type

    conf

  • DOI
    10.1109/ICCCE.2008.4580742
  • Filename
    4580742