Title :
Study on ultrasonic measuring component of binary gas
Author :
Yifeng, Jiang ; Lin, Shen ; Zhengwei, Zhu
Author_Institution :
Dept. of Electr. & Inf. Eng., Jiangsu Teachers Univ. of Technol., Changzhou, China
Abstract :
In this paper, a new method is proposed for analyzing components of binary gas. An equation for measuring binary gas is deduced theoretically. It is found that the velocity of the ultrasonic wave in the binary gas has a relation with the gas concentration. Although the rate of speed change is very small, change in the phase of velocity can be obvious. An implementation of the research project is introduced from the points of theoretical analysis, system collectivity design and functional modules. Dual channel and measuring phase are used to measure the ultrasonic wave propagation time. Difference phase comparison is used to realize the accurate measurement for gas mixture. The shortcoming in conventional sound-time measurement is overcomed. In order to increase the device´s precision, measures such as temperature compensation are adopted. The relation between the temperature and the dual-ultrasonic phase difference and the relation between the gas thickness and the dual-ultrasonic phase difference are found by experiments. Reasonable compensation has been made to those relations by software.
Keywords :
chemical analysis; gas mixtures; gas sensors; hardware description languages; physics computing; ultrasonic measurement; ultrasonic propagation; binary gas; conventional sound-time measurement; dual channel; dual-ultrasonic phase difference; functional modules; gas concentration; ultrasonic measuring component; ultrasonic wave propagation time; ultrasonic wave velocity; Acoustic propagation; Application software; Detectors; Monitoring; Phase measurement; Piezoelectric effect; Pollution measurement; Temperature measurement; Time measurement; Ultrasonic variables measurement; CPLD; Environmental Data Acquisition; Ultrasonic Measuring;
Conference_Titel :
Networking, Sensing and Control (ICNSC), 2010 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-6450-0
DOI :
10.1109/ICNSC.2010.5461578