Title :
Realistic sampling-circuit model for a nose-to-nose simulation
Author :
Remley, K.A. ; Williams, D.F. ; DeGroot, D.C.
Author_Institution :
RF Electron. Group, Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We extend previously developed oscilloscope sampler models to include realistic circuit characteristics and use these models to investigate the nose-to-nose calibration technique.
Keywords :
calibration; cathode-ray oscilloscopes; circuit simulation; microwave measurement; signal sampling; circuit characteristics; nose-to-nose calibration technique; nose-to-nose simulation; oscilloscope sampler models; sampling-circuit model; Calibration; Capacitance; Circuit simulation; Diodes; Impedance; NIST; Oscilloscopes; SPICE; Sampling methods; Transfer functions;
Conference_Titel :
Microwave Symposium Digest. 2000 IEEE MTT-S International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-5687-X
DOI :
10.1109/MWSYM.2000.862253
