A comprehensive millimeter-wave calibration development and verification approach

Author

Okamura, W.M. ; DuFault, M.M. ; Sharma, A.K.

Author_Institution

Electron. & Technol. Div., TRW Space & Electron Group, Redondo Beach, CA, USA

Volume

3

fYear

2000

fDate

11-16 June 2000

Firstpage

1477

Abstract

A comprehensive millimeter-wave calibration development and verification approach for on-wafer SOLT (Short-Open-Load-Through) standards is presented. Multiline TRL calibration procedures as well as EM simulations are used to develop initial SOLT calibration models which include the effects due to dispersion, metallization thickness, and distributed load. The models are then verified with offset open and load structures which cover all regions of the Smith chart in a frequency band. Theoretical and experimental verification of offset structures in K, Q, and V bands demonstrate good accuracy and repeatability of measurements.

Keywords

calibration; dispersion (wave); measurement standards; millimetre wave circuits; millimetre wave measurement; EM simulations; K band; Q band; Smith chart; V band; dispersion; distributed load; metallization thickness; millimeter-wave calibration; multiline TRL calibration procedures; offset structures; on-wafer SOLT; short-open-load-through standards; verification approach; Calibration; Dispersion; Electromagnetic measurements; Frequency; Impedance; Load modeling; Measurement standards; Millimeter wave technology; Space technology; Standards development;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest. 2000 IEEE MTT-S International

Conference_Location

Boston, MA, USA

ISSN

0149-645X

Print_ISBN

0-7803-5687-X

Type

conf

DOI

10.1109/MWSYM.2000.862254

Filename

862254