• DocumentCode
    2326462
  • Title

    Fault-tolerant sorting using VLSI processor arrays

  • Author

    Youn, Hee Yong ; Lee, Kyung Ook

  • Author_Institution
    Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
  • fYear
    1993
  • fDate
    27-29 Oct 1993
  • Firstpage
    25
  • Lastpage
    32
  • Abstract
    Parallel sorting is one of the most important computational problem. An efficient scheme for fault tolerant sorting is proposed, which is based on odd-even transposition sort with a linear array of processing elements (PEs). The faults in the array are tolerated as far as no more than a single compare-and-swap (CS) module fault exists in any three consecutive CS modules using the voting approach. The hardware overhead is basically an additional register and a voter per PE. The scheme can also be easily adapted to a two-dimensional processor arrays, using Shear sort. If the proposed approach is employed for only error detection, then multiple faults can be detected in each step of computation using only a simple XOR circuitry in each PE
  • Keywords
    VLSI; 2D implementation; Shear sort; VLSI processor arrays; XOR circuitry; additional register; error detection; fault tolerant sorting; hardware overhead; linear array; multiple faults; odd-even transposition sort; parallel sorting; register faults; single compare and swap module fault; two-dimensional processor arrays; voting; Circuit faults; Concurrent computing; Electrical fault detection; Fault detection; Fault tolerance; Hardware; Registers; Sorting; Very large scale integration; Voting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
  • Conference_Location
    Venice
  • ISSN
    1550-5774
  • Print_ISBN
    0-8186-3502-9
  • Type

    conf

  • DOI
    10.1109/DFTVS.1993.595609
  • Filename
    595609