DocumentCode
2326462
Title
Fault-tolerant sorting using VLSI processor arrays
Author
Youn, Hee Yong ; Lee, Kyung Ook
Author_Institution
Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
fYear
1993
fDate
27-29 Oct 1993
Firstpage
25
Lastpage
32
Abstract
Parallel sorting is one of the most important computational problem. An efficient scheme for fault tolerant sorting is proposed, which is based on odd-even transposition sort with a linear array of processing elements (PEs). The faults in the array are tolerated as far as no more than a single compare-and-swap (CS) module fault exists in any three consecutive CS modules using the voting approach. The hardware overhead is basically an additional register and a voter per PE. The scheme can also be easily adapted to a two-dimensional processor arrays, using Shear sort. If the proposed approach is employed for only error detection, then multiple faults can be detected in each step of computation using only a simple XOR circuitry in each PE
Keywords
VLSI; 2D implementation; Shear sort; VLSI processor arrays; XOR circuitry; additional register; error detection; fault tolerant sorting; hardware overhead; linear array; multiple faults; odd-even transposition sort; parallel sorting; register faults; single compare and swap module fault; two-dimensional processor arrays; voting; Circuit faults; Concurrent computing; Electrical fault detection; Fault detection; Fault tolerance; Hardware; Registers; Sorting; Very large scale integration; Voting;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
Conference_Location
Venice
ISSN
1550-5774
Print_ISBN
0-8186-3502-9
Type
conf
DOI
10.1109/DFTVS.1993.595609
Filename
595609
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