Title :
Fault-tolerant sorting using VLSI processor arrays
Author :
Youn, Hee Yong ; Lee, Kyung Ook
Author_Institution :
Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
Abstract :
Parallel sorting is one of the most important computational problem. An efficient scheme for fault tolerant sorting is proposed, which is based on odd-even transposition sort with a linear array of processing elements (PEs). The faults in the array are tolerated as far as no more than a single compare-and-swap (CS) module fault exists in any three consecutive CS modules using the voting approach. The hardware overhead is basically an additional register and a voter per PE. The scheme can also be easily adapted to a two-dimensional processor arrays, using Shear sort. If the proposed approach is employed for only error detection, then multiple faults can be detected in each step of computation using only a simple XOR circuitry in each PE
Keywords :
VLSI; 2D implementation; Shear sort; VLSI processor arrays; XOR circuitry; additional register; error detection; fault tolerant sorting; hardware overhead; linear array; multiple faults; odd-even transposition sort; parallel sorting; register faults; single compare and swap module fault; two-dimensional processor arrays; voting; Circuit faults; Concurrent computing; Electrical fault detection; Fault detection; Fault tolerance; Hardware; Registers; Sorting; Very large scale integration; Voting;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
Conference_Location :
Venice
Print_ISBN :
0-8186-3502-9
DOI :
10.1109/DFTVS.1993.595609