Title :
Super-resolution restoration of continuous image sequence using the LMS algorithm
Author :
Elad, M. ; Feuer, A.
Author_Institution :
Fac. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
Abstract :
In this paper, we propose computationally efficient super-resolution restoration algorithm for blurred, noisy and down-sampled continuous image sequence. The proposed approach is based on a constrained least squares (CLS) super-resolution algorithm, applied recursively in time. An updating equation based on the instantaneous squared error gradient gives a block-LMS version algorithm. An adaptive regularization term is shown to improve the restored image sequence quality by forcing smoothness, while preserving edges. The computation complexity of the obtained algorithm is of the order O{L/sup 2/log(L)} per one output image, where L/sup 2/ is the number of pixels in the output image. Simulations carried out on test sequences prove this method to be applicable, efficient, and with very promising results. A frequency domain version (FDBLMS) of the algorithm is proposed for special cases, with further improvement in computational complexity, and rate of convergence.
Keywords :
computational complexity; convergence of numerical methods; image resolution; image restoration; image sequences; least mean squares methods; LMS algorithm; adaptive regularization term; block-LMS version; blurred image; computation complexity; constrained least squares; continuous image sequence; convergence rate; down-sampled image; frequency domain version; image smoothing; instantaneous squared error gradient; noisy image; restored image sequence; super-resolution restoration algorithm; updating equation; Computational complexity; Computational modeling; Equations; Frequency domain analysis; Image resolution; Image restoration; Image sequences; Least squares methods; Pixel; Testing;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 1995., Eighteenth Convention of
Conference_Location :
Tel Aviv, Israel
Print_ISBN :
0-7803-2498-6
DOI :
10.1109/EEIS.1995.513799