Title :
Novel electromagnetic field probe using electro/magneto-optical crystals mounted on optical fiber facets for microwave circuit diagnosis
Author :
Wakana, S. ; Ohara, T. ; Abe, M. ; Yamazaki, E. ; Kishi, M. ; Tsuchiya, M.
Author_Institution :
Dept. of Electron. Eng., Tokyo Univ., Japan
Abstract :
We propose a new class of electromagnetic field probing scheme for microwave planar circuit diagnosis. The measurement principle is based on electro-optic/magneto-optic crystals mounted on optical fiber facets. Combining those fiber edge probes with a CW semiconductor laser source, a fast photodetector and an RF spectrum analyzer, electromagnetic field intensity on a microstrip transmission line has been measured in the frequency domain, where voltage and current amplitudes have been independently investigated with sensitivities of 30 mV and 0.6 mA, respectively.
Keywords :
Electro-optical devices; Electromagnetic fields; Fault diagnosis; Field strength measurement; Integrated circuit testing; MMIC; Magneto-optical devices; Microstrip lines; Microwave measurement; Microwave photonics; Optical fibres; Photodetectors; Probes; Spectral analysers; CW semiconductor laser source; RF spectrum analyzer; circuit diagnosis; current amplitudes; electro-optical crystals; electromagnetic field intensity; electromagnetic field probe; fiber edge probes; frequency domain; magneto-optical crystals; microstrip transmission line; microwave planar circuit; optical fiber facets; photodetector; voltage amplitudes; Crystals; Electromagnetic fields; Electromagnetic measurements; Fiber lasers; Lasers and electrooptics; Magnetic field measurement; Microwave circuits; Optical fibers; Probes; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest. 2000 IEEE MTT-S International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-5687-X
DOI :
10.1109/MWSYM.2000.862286
