DocumentCode
2326797
Title
3D-terahertz-tomography for material inspection and security
Author
Quast, Holger ; Löffler, Torsten
Author_Institution
SynView GmbH, Glashuetten, Germany
fYear
2009
fDate
21-25 Sept. 2009
Firstpage
1
Lastpage
2
Abstract
We demonstrate all-electronic 3D Terahertz tomographic imaging with an extraordinary dynamic range of higher than 40 dB combined with an extremely short acquisition time of 240 mus per pixel. Next to several application examples we discuss the potential for real-time operation for production line and security applications.
Keywords
materials testing; submillimetre wave imaging; tomography; 3D-terahertz-tomography imaging; material inspection; material security; Dynamic range; Frequency; Inspection; Optical imaging; Rough surfaces; Security; Surface roughness; Testing; Time measurement; Tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location
Busan
Print_ISBN
978-1-4244-5416-7
Electronic_ISBN
978-1-4244-5417-4
Type
conf
DOI
10.1109/ICIMW.2009.5325639
Filename
5325639
Link To Document