Title :
3D-terahertz-tomography for material inspection and security
Author :
Quast, Holger ; Löffler, Torsten
Author_Institution :
SynView GmbH, Glashuetten, Germany
Abstract :
We demonstrate all-electronic 3D Terahertz tomographic imaging with an extraordinary dynamic range of higher than 40 dB combined with an extremely short acquisition time of 240 mus per pixel. Next to several application examples we discuss the potential for real-time operation for production line and security applications.
Keywords :
materials testing; submillimetre wave imaging; tomography; 3D-terahertz-tomography imaging; material inspection; material security; Dynamic range; Frequency; Inspection; Optical imaging; Rough surfaces; Security; Surface roughness; Testing; Time measurement; Tomography;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5325639
