• DocumentCode
    2326857
  • Title

    A high speed Reed-Solomon encoder-decoder for fault tolerant solid state disks

  • Author

    Cardarilli, G. ; Di Zenzo, M. ; Pistilli, P. ; Salsano, A.

  • Author_Institution
    Univ. Degli Studi Di Roma - Tor Vergatta, Italy
  • fYear
    1993
  • fDate
    27-29 Oct 1993
  • Firstpage
    33
  • Lastpage
    40
  • Abstract
    Many applications actually require high performance, fault tolerant mass memories, which can be implemented using solid state devices. The high cost of semiconductor memories is a fundamental obstacle to the use of semiconductor devices instead of mechanical ones in mass storage memories. The use of faulty memories connected with an ECC VLSI circuit is proposed to overcome these problems. The authors present both a general purpose architecture which can be used as a transparent replacement of a normal hard disk and the coding-decoding circuit which uses the Reed-Solomon code for coding and an original modified error trapping technique for decoding. Using this algorithm it is possible to reach the high transfer rate necessary for high performance solid state disks (SSDs) and the requirements of fault tolerance needed to use faulty memories. The proposed decoding technique, patented, has been used by Texas Instruments in an on-the-shelf SSD
  • Keywords
    encoding; ECC VLSI circuit; Texas Instruments; coding-decoding circuit; cost; fault tolerant mass memories; fault tolerant solid state disks; faulty memories; general purpose architecture; high performance solid state disks; high speed Reed-Solomon encoder-decoder; high transfer rate; modified error trapping; on-the-shelf SSD; semiconductor memories; transparent replacement; Circuit faults; Costs; Decoding; Error correction codes; Fault tolerance; Reed-Solomon codes; Semiconductor devices; Semiconductor memory; Solid state circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
  • Conference_Location
    Venice
  • ISSN
    1550-5774
  • Print_ISBN
    0-8186-3502-9
  • Type

    conf

  • DOI
    10.1109/DFTVS.1993.595613
  • Filename
    595613