Title :
PEST-a tool for implementing pseudo-exhaustive self test
Author_Institution :
AT&T Bell Lab., Princeton, NJ, USA
Abstract :
Pseudo-exhaustive self-test (PEST) is a built-in self-test (BIST) methodology. This methodology guarantees 100% stuck-at fault coverage without fault simulation or test generation. PEST is a software tool developed to implement pseudo-exhaustive self-test. PEST has been used in two chip designs. This work briefly describes the pseudo-exhaustive self-test methodology and its implementation in the PEST software tool. Comparative advantages of pseudo-exhaustive self-test over other BIST methodologies are discussed. Before concluding with a short user guide, some facts about the tool are presented and reference given
Keywords :
built-in self test; fault location; integrated circuit testing; logic testing; software tools; PEST; built-in self-test; chip designs; fault simulation; pseudo-exhaustive self test; software tool; stuck-at fault coverage; user guide; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Integrated circuit testing; Logic; Sequential analysis; Software testing; Software tools; Vectors;
Conference_Titel :
Custom Integrated Circuits Conference, 1990., Proceedings of the IEEE 1990
Conference_Location :
Boston, MA
DOI :
10.1109/CICC.1990.124821
