DocumentCode :
232727
Title :
Effects of manufacturing limitations upon coplanar waveguide designs at high microwave frequencies
Author :
Anderson, C. ; Henderson, Robert ; Aroor, S.
Author_Institution :
Univ. of Texas at Dallas, Richardson, TX, USA
fYear :
2014
fDate :
3-4 April 2014
Firstpage :
1
Lastpage :
4
Abstract :
To date, the effect of dimensional errors using standard printed circuit board etch processes on the transmission line (TL) response at mm-wave frequencies has not been investigated. While sidewall curvature due to etch has a negligible effect upon transmission line characteristics when the dimensions are in units of mm - these dimensional errors can become significant at higher GHz frequencies where dimensions are 10s of micrometers to achieve a 50 Ohm line impedance. These various geometric errors are studied in terms of the broadband microwave and mm-wave response on coplanar waveguide (CPW) transmission lines.
Keywords :
coplanar waveguides; electronic equipment manufacture; high-frequency transmission lines; CPW transmission lines; TL response; broadband microwave response; coplanar waveguide transmission lines; dimensional errors; geometric errors; mm-wave frequencies; mm-wave response; resistance 50 ohm; sidewall curvature; standard printed circuit board etch processes; transmission line characteristics; transmission line response; Coplanar waveguides; Copper; Impedance; Integrated circuit modeling; Manufacturing; Surface treatment; Transmission line measurements; Electronic equipment manufacture; Microwave propagation; Millimeter wave propagation; etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wireless and Microwave Circuits and Systems (WMCS), 2014 Texas Symposium on
Conference_Location :
Waco, TX
Type :
conf
DOI :
10.1109/WMCaS.2014.7015871
Filename :
7015871
Link To Document :
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