Title :
Pressure and temperature change in electronic structure of strongly-correlated electron systems probed by IR microscope
Author :
Irizawa, A. ; Shimai, K. ; Nanba, T. ; Niitaka, S. ; Takagi, H.
Author_Institution :
Kobe Univ., Kobe, Japan
Abstract :
The pressure and temperature induced change in electronic structure of strongly-correlated systems, for example vanadate, has been directly observed using infrared micro-spectroscopy.
Keywords :
infrared spectra; strongly correlated electron systems; IR microscope; electronic structure; infrared microspectroscopy; pressure induced change; strongly-correlated electron systems; temperature induced change; Conductivity; Electron microscopy; Finite impulse response filter; Gold; Insulation; Metal-insulator structures; Optical distortion; Reflectivity; Semiconductor device measurement; Temperature dependence;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5325688
