DocumentCode
2327532
Title
A STAR GEM device for accurate transmittance measurements at an oblique angle of incidence
Author
Kawate, E.
Author_Institution
Nanoelectron. Res. Inst., AIST, Tsukuba, Japan
fYear
2009
fDate
21-25 Sept. 2009
Firstpage
1
Lastpage
2
Abstract
A few problems are discussed in transmittance measurements at an oblique angle of incidence. Incident angle dependence on transmittance of a 10 mm thick sample of silicon dioxide was measured by four kinds of experimental setups. Each measured transmittance was compared with theoretical one. The most reliable means of solving is that beams are directed to a detector by automatic adjusting of an angle of a mirror between the sample and the detector. This idea has been realized in a STAR GEM device.
Keywords
mirrors; optical sensors; reflectivity; refractive index; refractive index measurement; silicon compounds; STAR GEM device; geminated ellipsoid mirror; oblique angle of incidence; silicon dioxide; transmittance measurements; Detectors; Ellipsoids; Mirrors; Optical attenuators; Optical refraction; Optical scattering; Photovoltaic cells; Reflectivity; Silicon compounds; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location
Busan
Print_ISBN
978-1-4244-5416-7
Electronic_ISBN
978-1-4244-5417-4
Type
conf
DOI
10.1109/ICIMW.2009.5325716
Filename
5325716
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