DocumentCode
2327647
Title
Effects of pin depth in LCP 3.5 mm, 2.4 mm, and 1.0 mm connectors
Author
Szendrenyi, B.B.
Author_Institution
Mauty Microwave Corp., Ontario, CA, USA
Volume
3
fYear
2000
fDate
11-16 June 2000
Firstpage
1859
Abstract
A High Frequency Structure Simulator (HFSS) has been used to calculate the effect of pin depth (or pin gap) in popular coaxial connectors. The extremely low noise level (-100 dB) of the calculation is used to determine the low VSWR contribution of the recessed center conductor. This technique provides at least 20 dB lower level insight into the return loss values of pin depth over the data from vector network analyzer measurements.
Keywords
Coaxial cables; Electric connectors; Electromagnetic field theory; 1 to 3.5 mm; EM field solver; LCP connectors; coaxial connectors; high frequency structure simulator; low VSWR contribution; pin depth; pin gap; recessed center conductor; return loss values; Calibration; Coaxial components; Conductors; Connectors; Frequency measurement; Laboratories; Loss measurement; Metrology; Noise level; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest. 2000 IEEE MTT-S International
Conference_Location
Boston, MA, USA
ISSN
0149-645X
Print_ISBN
0-7803-5687-X
Type
conf
DOI
10.1109/MWSYM.2000.862343
Filename
862343
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