Title :
Characterization of silicon nanowires
Author :
Leung, D.M.H. ; Rahman, B.M.A. ; Tanvir, H. ; Ashraf, M.A. ; Kejalakshmy, N. ; Kabir, R.
Author_Institution :
Sch. of Eng. & Math. Sci., City Univ. London, London, UK
Abstract :
The full-vectorial H and E-field profiles along with Poynting vector are shown for several nanoscale silicon waveguides.
Keywords :
elemental semiconductors; finite element analysis; nanowires; optical waveguides; refractive index; semiconductor quantum wires; silicon; E-field profile; Si; finite element method; full-vectorial H-field profile; nanoscale silicon waveguides; poynting vector; silicon nanowire characterization; Nanowires; Numerical analysis; Waveguides;
Conference_Titel :
Electrical and Computer Engineering (ICECE), 2010 International Conference on
Conference_Location :
Dhaka
Print_ISBN :
978-1-4244-6277-3
DOI :
10.1109/ICELCE.2010.5700723
