Title :
Spectral terahertz topography
Author :
Ewers, Benjamin ; Kupsch, Andreas
Author_Institution :
Fed. Inst. for Mater. Res. & Testing (BAM), Berlin, Germany
Abstract :
THz-time domain spectroscopy (TDS) is utilised for spectrally resolved topography. Beyond pure imaging we employ a reflection set-up in order to demonstrate capabilities of computing 3D volume data for components of everyday communication electronics. The technique´s potentials in Non-Destructive Testing (NDT) are explored with respect to established methods.
Keywords :
nondestructive testing; terahertz wave spectra; 3D volume data; communication electronics; nondestructive testing; spectrally resolved topography; terahertz-time domain spectroscopy; Surfaces;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5325741
