Title :
Sensitive 320 Gb/s eye-diagram measurements via optical sampling with a semiconductor optical amplifier - ultrafast nonlinear interferometer
Author :
Kang, I. ; Dreyer, K.
Author_Institution :
Lucent Technol. Bell Labs., Holmdel, NJ, USA
Abstract :
We report high bit-rate (320 Gb/s) all optical eye measurements requiring only milliwatt signal power and 25-fJ sampling pulse energy. The system is based on a semiconductor optical amplifier interferometer with time-domain filtering of the ASE noise.
Keywords :
light interferometers; nonlinear optics; optical noise; semiconductor optical amplifiers; signal sampling; superradiance; time-varying filters; 25 fJ; 320 Gbit/s; ASE noise; optical eye-diagram measurements; optical sampling; semiconductor optical amplifier; time-domain filtering; ultrafast nonlinear interferometer; Nonlinear optics; Optical filters; Optical interferometry; Optical noise; Optical sensors; Pulse measurements; Sampling methods; Semiconductor optical amplifiers; Stimulated emission; Ultrafast optics;
Conference_Titel :
Optical Fiber Communications Conference, 2003. OFC 2003
Print_ISBN :
1-55752-746-6
DOI :
10.1109/OFC.2003.1248301
