DocumentCode
2327946
Title
Sensitive 320 Gb/s eye-diagram measurements via optical sampling with a semiconductor optical amplifier - ultrafast nonlinear interferometer
Author
Kang, I. ; Dreyer, K.
Author_Institution
Lucent Technol. Bell Labs., Holmdel, NJ, USA
fYear
2003
fDate
23-28 March 2003
Firstpage
406
Abstract
We report high bit-rate (320 Gb/s) all optical eye measurements requiring only milliwatt signal power and 25-fJ sampling pulse energy. The system is based on a semiconductor optical amplifier interferometer with time-domain filtering of the ASE noise.
Keywords
light interferometers; nonlinear optics; optical noise; semiconductor optical amplifiers; signal sampling; superradiance; time-varying filters; 25 fJ; 320 Gbit/s; ASE noise; optical eye-diagram measurements; optical sampling; semiconductor optical amplifier; time-domain filtering; ultrafast nonlinear interferometer; Nonlinear optics; Optical filters; Optical interferometry; Optical noise; Optical sensors; Pulse measurements; Sampling methods; Semiconductor optical amplifiers; Stimulated emission; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Fiber Communications Conference, 2003. OFC 2003
Print_ISBN
1-55752-746-6
Type
conf
DOI
10.1109/OFC.2003.1248301
Filename
1248301
Link To Document