DocumentCode :
2328054
Title :
Improved Lithographic Accuracy Using Image Registration Technology
Author :
Wang, Qiang ; Peng, Guohua ; Yang, Jing
Author_Institution :
Northwestern Polytech. Univ., Xi´´an, China
Volume :
2
fYear :
2011
fDate :
28-30 Oct. 2011
Firstpage :
19
Lastpage :
22
Abstract :
In order to improve lithographic accuracy, an image registration method based on spatial moments is suggested in this paper. First, match the reference image and the floating one using Fourier descriptors. This step is coarse matching. Second, locate edge accurately using spatial moments method and extract corner points. Finally, match the tow images according to the corner points extracted. This step is refine match. Experimental results show that accuracy of sub-pixel edge location can reach to 0.09 pixel and that of image registration can reach to 0.1 pixel.
Keywords :
edge detection; electronic engineering computing; feature extraction; image matching; image registration; lithography; Fourier descriptors; coarse matching; corner point extraction; image registration technology; lithographic accuracy; reference image matching; spatial moments; subpixel edge location; Computational intelligence; Decision support systems; Handheld computers; Manganese; image redistration; spatial moments; subpixel edge location;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence and Design (ISCID), 2011 Fourth International Symposium on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-4577-1085-8
Type :
conf
DOI :
10.1109/ISCID.2011.106
Filename :
6079726
Link To Document :
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