Title :
Don´t forget test! [design-for-test]
Author_Institution :
Ex-DFT consultant,
Abstract :
A personal view of the development and need for design for test (DFT).
Keywords :
Atmospheric modeling; Circuit faults; Design for testability; Discrete Fourier transforms; Testing;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2013.2271570
