• DocumentCode
    23284
  • Title

    Don´t forget test! [design-for-test]

  • Author

    Bennetts, R.G.

  • Author_Institution
    Ex-DFT consultant,
  • Volume
    30
  • Issue
    3
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    103
  • Lastpage
    104
  • Abstract
    A personal view of the development and need for design for test (DFT).
  • Keywords
    Atmospheric modeling; Circuit faults; Design for testability; Discrete Fourier transforms; Testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test, IEEE
  • Publisher
    ieee
  • ISSN
    2168-2356
  • Type

    jour

  • DOI
    10.1109/MDAT.2013.2271570
  • Filename
    6607172
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=23284