DocumentCode :
2328463
Title :
SIFT-based object recognition for tracking in infrared imaging system
Author :
Park, Changhan ; Jung, Sunghun
Author_Institution :
SIAT, Samsung Thales Co., Ltd., Yongin, South Korea
fYear :
2009
fDate :
21-25 Sept. 2009
Firstpage :
1
Lastpage :
2
Abstract :
In this paper, we propose an automatic object tracking and recognition in unknown environments by using scale-invariant feature transform (SIFT) in PowerPC-based infrared (IR) imaging system. Proposed method consists of two stages. First, we must localize the interest point in position and scale of moving objects. Second, we must build a description of the interest point and recognize moving objects. Proposed SIFT method for an effective feature extraction in PowerPC-based IR imaging system consists of scale space, extrema detection, orientation assignment, key point description, and feature matching. SIFT descriptor sets up extensive range about 1.5 times than visual image when feature value of SIFT in IR image is less than visual image. Based on experimental results, the proposed method is extracted object´s feature values in our system, and the result is presented by experiment.
Keywords :
feature extraction; image matching; infrared imaging; object recognition; target tracking; PowerPC-based infrared imaging system; SIFT-based object recognition; automatic object tracking; feature extraction; feature matching; scale-invariant feature transform; Feature extraction; Image recognition; Infrared detectors; Infrared imaging; Lighting; Morphological operations; Object detection; Object recognition; Object segmentation; Optical imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
Type :
conf
DOI :
10.1109/ICIMW.2009.5325785
Filename :
5325785
Link To Document :
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