DocumentCode
2328521
Title
Calculation of the reflection matrix in the plane waveguide by scanning screen method
Author
Aleksandrova, I.L. ; Pleshchinskii, N.B.
Author_Institution
Chebotarev Inst. of Math. & Mech., Kazan State Univ., Kazan
fYear
2008
fDate
June 29 2008-July 2 2008
Firstpage
170
Lastpage
172
Abstract
The possibility of calculation of coefficients of the reflection matrix partially describing inhomogeneous in the plane waveguide with metallic sides by bounded number of characteristics of the reflected field is studied. To receive the additional information it is proposed to use a thin conducting screen placed in front of the investigated heterogeneity.
Keywords
electromagnetic wave reflection; waveguide theory; plane waveguide; reflected field; reflection matrix; scanning screen method; thin conducting screen; Electromagnetic fields; Electromagnetic measurements; Electromagnetic reflection; Electromagnetic scattering; Electromagnetic waveguides; Matrix decomposition; Planar waveguides; Transmission line matrix methods; Waveguide components; Waveguide theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Mathematical Methods in Electromagnetic Theory, 2008. MMET 2008. 12th International Conference on
Conference_Location
Odesa
Print_ISBN
978-1-4244-2284-5
Type
conf
DOI
10.1109/MMET.2008.4580927
Filename
4580927
Link To Document