DocumentCode :
2328628
Title :
Towards Self-Organizing Mobility Robustness Optimization in Inter-RAT Scenario
Author :
Awada, Ahmad ; Wegmann, Bernhard ; Rose, Dirk ; Viering, Ingo ; Klein, Anja
Author_Institution :
Nokia Siemens Networks, Munich, Germany
fYear :
2011
fDate :
15-18 May 2011
Firstpage :
1
Lastpage :
5
Abstract :
The deployment of Long Term Evolution (LTE) system will be at first concentrated on areas with high user traffic overlaying with legacy second (2G) or third generation (3G) mobile system. Consequently, the limited LTE coverage will result in many inter-radio access technology (RAT) handovers from LTE to 2G/3G and vice versa. Trouble-free operation of inter-RAT handovers is very important for mobile operators. However, the joint parameter optimization of different RATs is complex and difficult with traditional optimization means. Thus, an autonomous inter-RAT mobility robustness optimization (MRO) is required. In this work, inter-RAT mobility problems and related inter-RAT key performance indicators (KPIs) are identified. Based on simulative investigations, the impact of the mobility parameters on KPIs is analyzed. Results show that the performance of the network highly depends on the configuration of the mobility parameters and there is a potential for developing a self-organizing inter-RAT MRO algorithm.
Keywords :
3G mobile communication; Long Term Evolution; mobility management (mobile radio); optimisation; radio access networks; 2G mobile system; 3G mobile system; LTE coverage; LTE system; Long Term Evolution system; autonomous interRAT MRO; interRAT KPI; interRAT key performance indicators; interradio access technology handovers; joint parameter optimization; second generation mobile system; self-organizing interRAT MRO algorithm; self-organizing mobility robustness optimization; third generation mobile system; Interference; Loss measurement; Mobile communication; Optimization; Quality of service; Rats; Signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference (VTC Spring), 2011 IEEE 73rd
Conference_Location :
Budapest
ISSN :
1550-2252
Print_ISBN :
978-1-4244-8332-7
Type :
conf
DOI :
10.1109/VETECS.2011.5956234
Filename :
5956234
Link To Document :
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