DocumentCode :
232876
Title :
Non-contact measurement of plastic film thickness
Author :
He Ping ; Liu Chao ; Li Qi ; Cao Shengmei
Author_Institution :
Dept. of Control Sci. & Eng., Harbin Inst. of Technol., Harbin, China
fYear :
2014
fDate :
28-30 July 2014
Firstpage :
7462
Lastpage :
7465
Abstract :
The market demand for plastic film has increased as the development of the national economy and the adjustment of industrial structure. In order to measure the film thickness during the process of film production, the project designs the on-line measurement system based on infrared technology. The system uses DSP as the control core. Firstly, the program of film thickness measurement was presented. Then modulation signal generation circuit was designed with NE555, and realized the stability outputs of the test signal using a steady flow circuit. After that, the signal acquisition and processing system for film thickness was designed. It consists of the A/D converting and filtering technology. Finally, the software process of the system was presented. With the experimental verification, the system has high efficiency, strong resistance to interference in the measurement, and it has a high practical value. The functions and indexes achieved the design requirements.
Keywords :
analogue-digital conversion; circuit stability; digital signal processing chips; infrared detectors; interference suppression; plastics; signal detection; signal generators; thickness measurement; thin film sensors; A/D conversion; DSP; NE555; film production process; filtering technology; industrial structure adjustment; infrared sensor technology; interference resistance; modulation signal generation circuit; national economy; noncontact measurement; plastic film thickness measurement; signal acquisition; signal processing; stability; steady flow circuit; Digital filters; Digital signal processing; Films; Production; Semiconductor device measurement; Thickness measurement; DSP; Digital Filter; Film Thickness; Non-contact Measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control Conference (CCC), 2014 33rd Chinese
Conference_Location :
Nanjing
Type :
conf
DOI :
10.1109/ChiCC.2014.6896241
Filename :
6896241
Link To Document :
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