DocumentCode :
2328840
Title :
Fault tolerance through automatic cell isolation using three-dimensional cellular genetic algorithms
Author :
Al-Naqi, Asmaa ; Erdogan, Ahmet T. ; Arslan, Tughrul
Author_Institution :
Sch. of Eng. & Electron., Univ. of Edinburgh, Edinburgh, UK
fYear :
2010
fDate :
18-23 July 2010
Firstpage :
1
Lastpage :
8
Abstract :
In this paper we propose a new algorithmic approach to achieve fault tolerance based on three dimensional cellular genetic algorithms (3D-cGAs). Herein, 3D architecture is targeted due to its amenability to implementation with current advanced custom silicon chip technology. The proposed approach is designed to exploit the inherent features of a cGA in which the genetic diversity is used as the key factor in identifying and isolating faulty individuals. A new migration schema is proposed as a mitigation technique. Several configurations concerning migration and selection intensity are considered. The approach is tested using four benchmark test functions and two real world problems which present different levels of difficulty. The overall results show that the proposed approach is able to cope with up to 40% soft errors (SEUs).
Keywords :
fault tolerant computing; genetic algorithms; statistical analysis; 3D architecture; advanced custom silicon chip technology; automatic cell isolation; benchmark test function; fault tolerance; migration schema; mitigation technique; selection intensity; three dimensional cellular genetic algorithm; Complexity theory; Entropy; Fault tolerance; Fault tolerant systems; Genetics; Hardware; Topology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Evolutionary Computation (CEC), 2010 IEEE Congress on
Conference_Location :
Barcelona
Print_ISBN :
978-1-4244-6909-3
Type :
conf
DOI :
10.1109/CEC.2010.5586209
Filename :
5586209
Link To Document :
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