Title :
Inspection allocation in manufacturing systems: a genetic algorithm approach
Author :
Taneja, Mukesh ; Viswanadham, N.
Author_Institution :
Dept. of Comput. Sci. & Autom., Indian Inst. of Sci., Bangalore, India
Abstract :
In this paper, the authors are concerned with the problem of location of inspection centers in a multistage manufacturing system. A genetic algorithm based approach is developed to determine the location of inspection centers resulting in a minimum expected total cost. The total cost includes inspection, manufacturing and scrapping cost at each stage of the manufacturing process. A penalty cost is included in it to account for a defective item which is not detected by the inspection scheme. A set of test problems are solved using this algorithm
Keywords :
genetic algorithms; inspection; operations research; optimisation; quality control; defective item; genetic algorithm approach; inspection allocation; manufacturing systems; minimum expected total cost; multistage manufacturing system; penalty cost; Algorithm design and analysis; Computer science; Costs; Genetic algorithms; Inspection; Manufacturing automation; Manufacturing processes; Manufacturing systems; Raw materials; System testing;
Conference_Titel :
Robotics and Automation, 1994. Proceedings., 1994 IEEE International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-8186-5330-2
DOI :
10.1109/ROBOT.1994.351027
