DocumentCode :
2329151
Title :
An integrated common-mode feedback topology for multi-frequency bioimpedance imaging
Author :
Rahal, Mohamad ; Demosthenous, Andreas ; Bayford, Richard
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. Coll. London, London, UK
fYear :
2009
fDate :
14-18 Sept. 2009
Firstpage :
416
Lastpage :
419
Abstract :
One of the key limitations in medical impedance imaging and bio-impedance measurements is common-mode errors. We present an integrated common-mode feedback topology which reduces these errors for use in a bio-imaging system for in-vivo monitoring of neonate lung function (10-200 kHz current injection frequency). A frequency-selective feedback network is described which reduces the common-mode voltage due to electrode impedance mismatch at the input of the differential amplifier. The theory and key design blocks are presented. The circuit was implemented in a 5-V 0.35-mum CMOS technology, occupying an area of 0.75 mm2 and dissipating about 20 mW. Experiments were conducted using, an RC model of the electrodes, and ECG electrodes on the forearm to demonstrate the working of the integrated circuit. Measured results show that the common-mode signal is reduced by 85%, 75%, 70% and 65% at 10 kHz, 50 kHz, 100 kHz and 200 kHz, respectively.
Keywords :
RC circuits; bioelectric phenomena; biomedical equipment; differential amplifiers; electric impedance imaging; electrocardiography; feedback; paediatrics; CMOS technology; ECG electrodes; bioimaging system; common mode errors; common mode voltage reduction; current injection frequency; differential amplifier input; electrode RC model; electrode impedance mismatch; frequency 10 kHz to 200 kHz; frequency selective feedback network; integrated common mode feedback topology; medical impedance imaging; multifrequency bioimpedance imaging; neonate lung function in vivo monitoring; size 0.35 mum; size 0.75 mum; voltage 5 V; Bioimpedance; Biomedical imaging; Biomedical monitoring; CMOS technology; Electrodes; Feedback; Frequency; Impedance measurement; Integrated circuit modeling; Network topology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ESSCIRC, 2009. ESSCIRC '09. Proceedings of
Conference_Location :
Athens
ISSN :
1930-8833
Print_ISBN :
978-1-4244-4354-3
Type :
conf
DOI :
10.1109/ESSCIRC.2009.5325943
Filename :
5325943
Link To Document :
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