Title :
Assessment of the impact of technology scaling on the performance of LC-VCOs
Author :
Ponton, D. ; Knoblinger, G. ; Roithmeier, A. ; Tiebout, M. ; Fulde, M. ; Palestri, P.
Author_Institution :
DIEGM, Univ. of Udine, Udine, Italy
Abstract :
This paper analyzes the scaling of LC Voltage Controlled Oscillator (LC-VCO) implemented in advanced Planar CMOS technologies. An LC-VCO for GSM applications, has been designed in state-of-the-art 45/40 nm and 32 nm CMOS technologies, exploiting different Front- and Back-End Of Line (FEOL/BEOL) options. The designs are compared with each other and with recent literature in terms of power and phase-noise performance.
Keywords :
CMOS integrated circuits; cellular radio; microwave integrated circuits; microwave oscillators; phase noise; voltage-controlled oscillators; BEOL; FEOL; GSM applications; LC voltage controlled oscillator scaling technology; LC-VCO performance; advanced planar CMOS technologies; back-end of line; front-end of line; phase-noise performance; size 32 nm; size 40 nm; size 45 nm; state-of-the-art CMOS technologies; Bridge circuits; CMOS technology; GSM; Impedance; MOS devices; Radio frequency; Topology; Tuning; Varactors; Voltage control;
Conference_Titel :
ESSCIRC, 2009. ESSCIRC '09. Proceedings of
Conference_Location :
Athens
Print_ISBN :
978-1-4244-4354-3
DOI :
10.1109/ESSCIRC.2009.5325944
