DocumentCode
2329224
Title
Memristors based on an organic monolayer of molecules and a thin film of solid electrolytes
Author
Islam, M. Saif ; Johns, Chad ; Do, Long ; Ohlberg, Doug A A ; Wang, Shih-Yuan ; Williams, R.Stanley
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of California Davis, Davis, CA, USA
fYear
2010
fDate
18-20 Dec. 2010
Firstpage
761
Lastpage
764
Abstract
The memristor is a fundamental circuit element (along with capacitor, resistor and inductor) whose conductance is dependent on the previous functioning history. The concept was postulated almost four decades ago and was actually fabricated only recently. We report the fabrication of memristive junctions using an insulating film of a monolayer of cadmium stearate deposited using the Langmuir-Blodgett method in the gap of an inert electrode and a chalcogenide solid electrolyte. The thickness of the organic monolayer is about 2.8nm and its presence helps ensure a constant gap size between the electrodes. We used an energetic plasma process to create the chalcogenide solid electrolyte using sulfur (S) containing plasma for converting thin films of copper (Cu) into a mix of covelite phase CuS and chalcocite phase Cu2S.
Keywords
electrolytes; memristors; thin films; C2S; Cu; CuS; Langmuir-Blodgett method; S; capacitor; chalcogenide solid electrolyte; circuit element; conductance; energetic plasma process; inductor; inert electrode; memristive junction; memristors; organic monolayer; resistor; thin film;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering (ICECE), 2010 International Conference on
Conference_Location
Dhaka
Print_ISBN
978-1-4244-6277-3
Type
conf
DOI
10.1109/ICELCE.2010.5700804
Filename
5700804
Link To Document