• DocumentCode
    2329224
  • Title

    Memristors based on an organic monolayer of molecules and a thin film of solid electrolytes

  • Author

    Islam, M. Saif ; Johns, Chad ; Do, Long ; Ohlberg, Doug A A ; Wang, Shih-Yuan ; Williams, R.Stanley

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California Davis, Davis, CA, USA
  • fYear
    2010
  • fDate
    18-20 Dec. 2010
  • Firstpage
    761
  • Lastpage
    764
  • Abstract
    The memristor is a fundamental circuit element (along with capacitor, resistor and inductor) whose conductance is dependent on the previous functioning history. The concept was postulated almost four decades ago and was actually fabricated only recently. We report the fabrication of memristive junctions using an insulating film of a monolayer of cadmium stearate deposited using the Langmuir-Blodgett method in the gap of an inert electrode and a chalcogenide solid electrolyte. The thickness of the organic monolayer is about 2.8nm and its presence helps ensure a constant gap size between the electrodes. We used an energetic plasma process to create the chalcogenide solid electrolyte using sulfur (S) containing plasma for converting thin films of copper (Cu) into a mix of covelite phase CuS and chalcocite phase Cu2S.
  • Keywords
    electrolytes; memristors; thin films; C2S; Cu; CuS; Langmuir-Blodgett method; S; capacitor; chalcogenide solid electrolyte; circuit element; conductance; energetic plasma process; inductor; inert electrode; memristive junction; memristors; organic monolayer; resistor; thin film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering (ICECE), 2010 International Conference on
  • Conference_Location
    Dhaka
  • Print_ISBN
    978-1-4244-6277-3
  • Type

    conf

  • DOI
    10.1109/ICELCE.2010.5700804
  • Filename
    5700804