DocumentCode :
2329374
Title :
A digitally calibrated 14-bit linear 100-MS/s pipelined ADC with wideband sampling frontend
Author :
Luo, Lei ; Lin, Kaihui ; Cheng, Long ; Zhou, Liren ; Ye, Fan ; Ren, Junyan
Author_Institution :
State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
fYear :
2009
fDate :
14-18 Sept. 2009
Firstpage :
472
Lastpage :
475
Abstract :
A 14-bit 100-MS/s pipelined ADC in 0.18 mum 1P6M CMOS process is presented. A new sampling technique is introduced which achieves high linearity over wide bandwidth by eliminating the major sources of distortion at low and high input frequencies. The ADC uses digital background calibration, featuring a shuffled-dithering scheme, to obtain a DNL of +0.18/-0.18 LSB and an INL of +1.1/-0.6 LSB. It achieves over 85 dB SFDR and 65 dB SNDR within the first Nyquist zone, maintains over 74 dB SFDR and 63 dB SNDR for input signals up to 400 MHz and consumes 220 mW at 1.8 V supply.
Keywords :
CMOS digital integrated circuits; Nyquist criterion; analogue-digital conversion; calibration; 14-bit pipelined ADC; 1P6M CMOS process; Nyquist zone; digital background calibration; frequency 400 MHz; power 220 mW; shuffled-dithering scheme; size 0.18 mum; voltage 1.8 V; wideband sampling; Bandwidth; Calibration; Capacitance; Circuits; Frequency; Linearity; Sampling methods; Signal sampling; Switches; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ESSCIRC, 2009. ESSCIRC '09. Proceedings of
Conference_Location :
Athens
ISSN :
1930-8833
Print_ISBN :
978-1-4244-4354-3
Type :
conf
DOI :
10.1109/ESSCIRC.2009.5325956
Filename :
5325956
Link To Document :
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