DocumentCode :
2329377
Title :
Particle-Growth Caused By Film Deposition In VLSI Manufacturing Process
Author :
Takii, Y. ; Miyoshi, Yasuyuki ; Horofuji, Y.
Author_Institution :
Matsushita Electric Industrial Co.,Ltd.
fYear :
1994
fDate :
21-22 June 1994
Firstpage :
107
Lastpage :
110
Abstract :
A new method for forming imaginary-particles with various sizes and materials was developed, and particle growth caused by film deposition in VLSI manufacturing process was investigated by using imaginary-particles. Consequently, particle growth was strongly dependent on film thickness and step-coverage decided by film deposition method, and the study with imaginary-particles was very effective to explicate the particle growth mechanism.
Keywords :
Artificial intelligence; Lithography; Manufacturing industries; Manufacturing processes; Plasma applications; Productivity; Semiconductor films; Semiconductor materials; Size control; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing, 1994. Extended Abstracts of ISSM '94. 1994 International Symposium on
Conference_Location :
Tokyo, Japan
Type :
conf
DOI :
10.1109/ISSM.1994.729433
Filename :
729433
Link To Document :
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