DocumentCode :
2329459
Title :
XML API-Based Test Framework of Extension Interface Using Software Mutation Analysis for Component
Author :
Xia Qiming ; Nie Nan ; Yao Junfeng ; He Keqing
Author_Institution :
State Key Lab. of Software Eng., Wuhan Univ., Wuhan
fYear :
2009
fDate :
23-24 May 2009
Firstpage :
1
Lastpage :
5
Abstract :
The components of different platforms usually need their proprietary testing languages to execute test cases. Thus it is essential to propose XML API-based test framework, which builds on standard component and supports different languages test on cross platforms. This study developed a general component extension test Interface (CETI) consisted of 4 kinds of function ports. Then on the basis of the traditional component interface mutation, it provides an XML API-based extension interface mutation testing approach which uses XML as test specification language. In addition, XACML- based API presents a technique for using mutation analysis to test the semantic correctness of component access control interface. The test framework has a lot of advantages, such as the multi-functional and visual testing interface, cross-platform and general-purpose test script language. The preliminary experiments show that it can be used towards different application platforms, such as Linux, Windows and component testing environments, for example, CORBA, EJB and COM et al.
Keywords :
XML; application program interfaces; authorisation; object-oriented programming; program testing; specification languages; XML API-based test framework; component access control interface; component extension test Interface; component-based software; software mutation analysis; test case execution; test specification language; Access control; Automatic testing; Communication industry; Computer industry; Genetic mutations; Helium; Laboratories; Software engineering; Software testing; XML;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
E-Business and Information System Security, 2009. EBISS '09. International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-2909-7
Electronic_ISBN :
978-1-4244-2910-3
Type :
conf
DOI :
10.1109/EBISS.2009.5138148
Filename :
5138148
Link To Document :
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