• DocumentCode
    2329880
  • Title

    Impedance extraction for 3-D structures with multiple dielectrics using preconditioned boundary element method

  • Author

    Yi, Yang ; Li, Peng ; Sarin, Vivek ; Shi, Weiping

  • Author_Institution
    Texas A&M Univ., College Station
  • fYear
    2007
  • fDate
    4-8 Nov. 2007
  • Firstpage
    7
  • Lastpage
    10
  • Abstract
    In this paper, we present the first BEM impedance extraction algorithm for multiple dielectrics. The effect of multiple dielectrics is significant and efficient modeling is challenging. However, previous BEM algorithms, including Fastlmp and EastPep, assume uniform dielectric, thus causing considerable errors. The new algorithm introduces a circuit formulation which makes it possible to utilizes either multilayer Green´s function or equivalent charge method to extract impedance in multiple dielectrics. The novelty of the formulation is the reduction of the number of unknowns and the application of the hierarchical data structure. The hierarchical data structure permits efficient sparsification transformation and preconditioners to accelerate the linear equation solver. Experimental results demonstrate that the new algorithm is accurate and efficient. For uniform dielectric problems, the new algorithm is one magnitude faster than Fastlmp, while its results differ from Fastlmp within 2%. For multiple dielectrics problems, its relative error with respect to HFSS is below 3%.
  • Keywords
    Green´s function methods; boundary-elements methods; circuit CAD; data structures; dielectric materials; multilayers; 3-D structures; BEM impedance extraction algorithm; equivalent charge method; hierarchical data structure; linear equation; multilayer Green´s function; multiple dielectrics; preconditioned boundary element method; sparsification transformation; Acceleration; Boundary element methods; Circuits; Data mining; Data structures; Dielectrics; Equations; Green´s function methods; Impedance; Nonhomogeneous media;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4244-1381-2
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2007.4397236
  • Filename
    4397236