DocumentCode :
2329885
Title :
Design Optimization Of Gas Pumping System For Ultra Clean Reduced-Gas-Pressure Processing Equipment
Author :
Konishi, N. ; Shibata, T. ; Ohmi, T.
Author_Institution :
Tohoku University
fYear :
1994
fDate :
21-22 June 1994
Firstpage :
213
Lastpage :
214
Abstract :
Impurity back diffusion through a UHV pump in reduced-gas-processing chambers has been experimentally studied. A large throughput of process gases severely degrades the main UHV pump capability in dragging impurities, resulting in the back diffusion of impurities to the processing chamber. Such degradation is greatly influenced by the pumping speed of the backing pump. However, we have found for the first time that the impurity level in the chamber can be made even lower than that for the best performance under UHV when the gas flow rate is optimized for the system. The scenario to the gas pumping system optimization is presented.
Keywords :
Degradation; Design engineering; Design optimization; Fluid flow; Gases; Helium; Impurities; Reproducibility of results; Semiconductor devices; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing, 1994. Extended Abstracts of ISSM '94. 1994 International Symposium on
Conference_Location :
Tokyo, Japan
Type :
conf
DOI :
10.1109/ISSM.1994.729459
Filename :
729459
Link To Document :
بازگشت