Title :
Stochastic extended Krylov subspace method for variational analysis of on-chip power grid networks
Author :
Mi, Ning ; Tan, Sheldon X D ; Liu, Pu ; Cui, Jian ; Cai, Yici ; Hong, Xianlong
Author_Institution :
California Univ., Riverside
Abstract :
In this paper, we propose a novel stochastic method for analyzing the voltage drop variations of on-chip power grid networks with log-normal leakage current variations. The new-method, called StoEKS, applies Hermite polynomial chaos (PC) to represent the random variables in both power grid networks and input leakage currents. But different from the existing Hermit PC based stochastic simulation method, extended Krylov subspace method (EKS) is employed to compute variational responses using the augmented matrices consisting of the coefficients of Hermite polynomials. Our contribution lies in the combination of the statistical spectrum method with the extended Krylov subspace method to fast solve the variational circuit equations for the first time. Experimental results show that the proposed method is about two-order magnitude faster than the existing Hermite PC based simulation method and more order of magnitudes faster than Monte Carlo methods with marginal errors. StoEKS also can analyze much larger circuits than the exiting Hermit PC based methods.
Keywords :
leakage currents; matrix algebra; normal distribution; polynomials; power grids; random processes; stochastic processes; system-on-chip; variational techniques; Hermite polynomial chaos; Monte Carlo method; augmented matrix; log-normal distribution; log-normal leakage current variation; marginal error; on-chip power grid network; random variable; statistical spectrum method; stochastic extended Krylov subspace method; variational analysis; voltage drop variation; Chaos; Circuit simulation; Computational modeling; Leakage current; Network-on-a-chip; Polynomials; Power grids; Random variables; Stochastic processes; Voltage;
Conference_Titel :
Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1381-2
Electronic_ISBN :
1092-3152
DOI :
10.1109/ICCAD.2007.4397242