DocumentCode :
2330157
Title :
Automating post-silicon debugging and repair
Author :
Chang, Kai-Hui ; Markov, Igor L. ; Bertacco, Valeria
Author_Institution :
Univ. of Michigan, Ann Arbor
fYear :
2007
fDate :
4-8 Nov. 2007
Firstpage :
91
Lastpage :
98
Abstract :
Modern IC designs have reached unparalleled levels of complexity, resulting in more and more bugs discovered after design tape-out However, so far only very few EDA tools for post-silicon debugging have been reported in the literature. In this work we develop a methodology and new algorithms to automate this debugging process. Key innovations in our technique include support for the physical constraints specific to post-silicon debugging and the ability to repair functional errors through subtle modifications of an existing layout. In addition, our proposed post-silicon debugging methodology (FogClear) can repair some electrical errors while preserving functional correctness. Thus, by automating this traditionally manual debugging process, our contributions promise to reduce engineers´ debugging effort. As our empirical results show, we can automatically repair more than 70% of our benchmark designs.
Keywords :
elemental semiconductors; integrated circuit design; silicon; EDA tools; FogClear; IC designs; Si; functional errors repair; post-silicon debugging automation; Computer bugs; Debugging; Electronic design automation and methodology; Error correction; Logic testing; Manufacturing; Process design; Silicon; Technological innovation; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4244-1381-2
Electronic_ISBN :
1092-3152
Type :
conf
DOI :
10.1109/ICCAD.2007.4397249
Filename :
4397249
Link To Document :
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