• DocumentCode
    2330157
  • Title

    Automating post-silicon debugging and repair

  • Author

    Chang, Kai-Hui ; Markov, Igor L. ; Bertacco, Valeria

  • Author_Institution
    Univ. of Michigan, Ann Arbor
  • fYear
    2007
  • fDate
    4-8 Nov. 2007
  • Firstpage
    91
  • Lastpage
    98
  • Abstract
    Modern IC designs have reached unparalleled levels of complexity, resulting in more and more bugs discovered after design tape-out However, so far only very few EDA tools for post-silicon debugging have been reported in the literature. In this work we develop a methodology and new algorithms to automate this debugging process. Key innovations in our technique include support for the physical constraints specific to post-silicon debugging and the ability to repair functional errors through subtle modifications of an existing layout. In addition, our proposed post-silicon debugging methodology (FogClear) can repair some electrical errors while preserving functional correctness. Thus, by automating this traditionally manual debugging process, our contributions promise to reduce engineers´ debugging effort. As our empirical results show, we can automatically repair more than 70% of our benchmark designs.
  • Keywords
    elemental semiconductors; integrated circuit design; silicon; EDA tools; FogClear; IC designs; Si; functional errors repair; post-silicon debugging automation; Computer bugs; Debugging; Electronic design automation and methodology; Error correction; Logic testing; Manufacturing; Process design; Silicon; Technological innovation; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4244-1381-2
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2007.4397249
  • Filename
    4397249