Title :
A digitally-assisted electrothermal frequency-locked loop
Author :
Kashmiri, S.M. ; Makinwa, K.A.A.
Author_Institution :
Electron. Instrum. Lab., Delft Univ. of Technol., Delft, Netherlands
Abstract :
A digitally-assisted electrothermal frequency-locked loop (FLL) is presented, whose output frequency is determined by the temperature-dependent thermal diffusivity of bulk silicon. In contrast to previous work, its noise bandwidth is defined by a digital, rather than an analog, filter. This obviates the need for external capacitors, thus enabling full CMOS integration. Without trimming, an implementation in a 0.7 mum CMOS process achieves an output frequency spread of about plusmn0.3% (3sigma) from -55degC to 125degC. This corresponds to a temperature sensing inaccuracy of about plusmn0.7degC (3sigma).
Keywords :
CMOS integrated circuits; frequency locked loops; signal processing equipment; CMOS integration; bulk silicon; digitally assisted electrothermal frequency locked loop; size 0.7 mum; temperature 218.5 K to 398.15 K; temperature sensing; thermal diffusivity; Bandwidth; Capacitors; Demodulation; Digital filters; Electrothermal effects; Frequency locked loops; Silicon; System-level design; Temperature dependence; Temperature sensors;
Conference_Titel :
ESSCIRC, 2009. ESSCIRC '09. Proceedings of
Conference_Location :
Athens
Print_ISBN :
978-1-4244-4354-3
DOI :
10.1109/ESSCIRC.2009.5326001