Title : 
An efficient algorithm for time separation of events in concurrent systems
         
        
            Author : 
McGee, Peggy B. ; Nowick, Steven M.
         
        
            Author_Institution : 
Columbia Univ., New York
         
        
        
        
        
        
            Abstract : 
The time separation of events (TSE) problem is that of finding the maximum and minimum separation between the times of occurrence of two events in a concurrent system. It has applications in the performance analysis, optimization and verification of concurrent digital systems. This paper introduces an efficient polynomial-time algorithm to give exact bounds on TSE´s for choice-free concurrent systems, whose operational semantics obey the max-causality rule. A choice-free concurrent system is modeled as a strongly-connected marked graph, where delays on operations are modeled as bounded intervals with unspecified distributions. While previous approaches handle acyclic systems only, or else require graph unfolding until a steady-state behavior is reached, the proposed approach directly identifies and evaluates the asymptotic steady-state behavior of a cyclic system via a graph-theoretical approach. As a result, the method has significantly lower computational complexity than previously-proposed solutions. A prototype CAD tool has been developed to demonstrate the feasibility and efficacy of our method. A set of experiments have been performed on the tool as well as two existing tools, with noticeable improvement on runtime and accuracy for several examples.
         
        
            Keywords : 
computational complexity; computational geometry; graph theory; choice-free concurrent systems; events problem; graph-theoretical approach; max-causality rule; polynomial-time algorithm; strongly-connected marked graph; time separation; Circuits; Computational complexity; Convergence; Delay; Measurement; Performance analysis; Polynomials; Prototypes; Steady-state; Timing;
         
        
        
        
            Conference_Titel : 
Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
         
        
            Conference_Location : 
San Jose, CA
         
        
        
            Print_ISBN : 
978-1-4244-1381-2
         
        
            Electronic_ISBN : 
1092-3152
         
        
        
            DOI : 
10.1109/ICCAD.2007.4397263