DocumentCode
2330582
Title
Verifiable Fine-Grained Top-k Queries in Tiered Sensor Networks
Author
Zhang, Rui ; Shi, Jing ; Liu, Yunzhong ; Zhang, Yanchao
Author_Institution
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
fYear
2010
fDate
14-19 March 2010
Firstpage
1
Lastpage
9
Abstract
Most large-scale sensor networks are expected to follow a two-tier architecture with resource-poor sensor nodes at the lower tier and resource-rich master nodes at the upper tier. Master nodes collect data from sensor nodes and then answer the queries from the network owner on their behalf. In hostile environments, master nodes may be compromised by the adversary and then instructed to return fake and/or incomplete data in response to data queries. Such application-level attacks are more harmful and difficult to detect than blind DoS attacks on network communications, especially when the query results are the basis for making critical decisions such as military actions. This paper presents three schemes whereby the network owner can verify the authenticity and completeness of fine-grained top-k query results in tired sensor networks, which is the first work of its kind. The proposed schemes are built upon symmetric cryptographic primitives and force compromised master nodes to return both authentic and complete top-k query results to avoid being caught. Detailed theoretical and quantitative results confirm the high efficacy and efficiency of the proposed schemes.
Keywords
message authentication; query processing; telecommunication security; wireless sensor networks; application-level attacks; blind denial-of-service attacks; fine-grained top-k queries; resource-poor sensor nodes; resource-rich master nodes; symmetric cryptographic primitives; tiered sensor networks; Business; Communications Society; Computer architecture; Computer crime; Large-scale systems; Memory; Peer to peer computing; Query processing; Sensor phenomena and characterization; Wireless sensor networks;
fLanguage
English
Publisher
ieee
Conference_Titel
INFOCOM, 2010 Proceedings IEEE
Conference_Location
San Diego, CA
ISSN
0743-166X
Print_ISBN
978-1-4244-5836-3
Type
conf
DOI
10.1109/INFCOM.2010.5461927
Filename
5461927
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