• DocumentCode
    2330622
  • Title

    A technique of automatic monitor generation based on FSM

  • Author

    Duoli, Zhang ; Yukun, Song ; Gaoming, Du ; Yuanjie, Zhai

  • Author_Institution
    Inst. of VLSI Design, Hefei Univ. of Technol., Hefei
  • fYear
    2008
  • fDate
    Nov. 30 2008-Dec. 3 2008
  • Firstpage
    1775
  • Lastpage
    1778
  • Abstract
    Aiming at the requirements of real-time ability and good observability of result-checking in IC functional verification, a method was proposed to generate monitors automatically. Based on the requirements of the design property to be monitored, a sub-set was defined from the Property Specification Language (PSL), so that the objects to be monitored can be formally described. Based on the formal descriptions, monitors can be generated automatically through a two-step method. The formal descriptions are transferred into event sequences first. Then monitors are generated based on the event sequences through the method of FSM automatic construction. Mathematical model of the relationship between event sequence and FSM state evolving was put forward. Directed random analysis was applied in several serial interfaces to prove the effectiveness of our method. The results of analysis and the application based testing shows that the method proposed in this paper achieves better tradeoff between complex design property monitoring and the easiness to be mastered by verification engineers.
  • Keywords
    circuit CAD; finite state machines; formal verification; integrated circuit design; logic CAD; logic testing; specification languages; FSM; IC functional verification; automatic monitor generation; event sequences; formal descriptions; formal verification; property specification language; result-checking; simulation-based verification; Analytical models; Boolean functions; Computerized monitoring; Design engineering; Engines; Mathematical model; Observability; Protocols; Specification languages; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. APCCAS 2008. IEEE Asia Pacific Conference on
  • Conference_Location
    Macao
  • Print_ISBN
    978-1-4244-2341-5
  • Electronic_ISBN
    978-1-4244-2342-2
  • Type

    conf

  • DOI
    10.1109/APCCAS.2008.4746385
  • Filename
    4746385