DocumentCode :
2330901
Title :
Development of 3-D shapes estimation by using single X-ray image
Author :
Cho, Sung Man ; Shim, Hyuk-Hoon ; Jong-Hyeong Kim ; Song, Chun-Sam ; Kim, Joon Hyun ; Joo, Won Jong
Author_Institution :
Nano Manuf. Res. Center, Seoul Nat. Univ. of Technol., Seoul, South Korea
fYear :
2009
fDate :
21-23 Sept. 2009
Firstpage :
345
Lastpage :
350
Abstract :
X-ray images are heavily affected by noise which makes normal image processing not workable. This paper suggested a new method to identify the primary 3-D shape of an embedded object and its pose by using only single X-ray image. The image feature consists of corner points and edge/intersection lines of adjacent surfaces. The intensity of an X-ray image is attenuated exponentially with increasing the penetration thickness. The main finding is to model a precise exponential relationship to fit the variation of X-ray image intensity. It applied a least-square-method to the X-ray projection image and effectively extracted edges and intersection lines from the noise of X-ray image.
Keywords :
X-ray imaging; edge detection; exponential distribution; feature extraction; least squares approximations; shape measurement; shape recognition; 3D shape estimation; X-ray image intensity attenuation; X-ray image noise; X-ray projection image; corner points; edge detection; embedded object; exponential approximation; image feature; intersection line extraction; least square method; primary 3D shape; single X-ray image; vertex extraction; Costs; Digital signal processing; Hardware; Instruments; Paper technology; Shape; System testing; US Department of Defense; Weapons; X-ray imaging; Exponential approximation; Extraction edge; Leastsquar-method; X-ray;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optomechatronic Technologies, 2009. ISOT 2009. International Symposium on
Conference_Location :
Istanbul
Print_ISBN :
978-1-4244-4209-6
Electronic_ISBN :
978-1-4244-4210-2
Type :
conf
DOI :
10.1109/ISOT.2009.5326040
Filename :
5326040
Link To Document :
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