DocumentCode
2330994
Title
Assessment of contamination condition of insulator based on PSO-SVM
Author
Jiao, Shangbin ; Liu, Ding ; Xie, Guo ; Deng, Yi
Author_Institution
Dept. of Autom. of Eng., Xi´´an Univ. of Technol., Xi´´an, China
fYear
2009
fDate
25-27 May 2009
Firstpage
358
Lastpage
362
Abstract
Contamination grades assessment is the important content for the online monitoring system of insulator leakage current (LC). The difficult of assessment is the nonlinear relationship between the electric character variables of the LC, the environment factors and the contamination condition of insulator surface. In this paper, based on laboratory simulation experiments and field data, the parameters of support vector machine (SVM) is optimized by using particle swarm optimization (PSO) arithmetic, then the SVM pattern recognition model of assessment of the contamination grades is constructed. The method takes advantages of the minimum structure risk of SVM and the quickly globally optimizing ability of particle swarm, and the mapping relation between the root mean square (R.M.S.) of LC, the peak value of the LC, the amplitude and times of the pulses of the LC, temperature and humidity of environment and contamination grades may be setup quickly by learning from sample data. Experiment results show that the contamination condition assessment method is effective. Then the insulator contamination condition online detection system is developed based on the assessment model.
Keywords
condition monitoring; environmental factors; insulator contamination; leakage currents; least mean squares methods; mean square error methods; particle swarm optimisation; pattern recognition; power engineering computing; support vector machines; PSO-SVM; contamination condition assessment method; environment factors; insulator contamination condition; insulator leakage current; online monitoring system; particle swarm optimization; pattern recognition model; root mean square; support vector machine; Arithmetic; Dielectrics and electrical insulation; Laboratories; Leakage current; Optimization methods; Particle swarm optimization; Pattern recognition; Root mean square; Support vector machines; Surface contamination; Contamination grades assessment; Insulator; PSO; SVM;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-2799-4
Electronic_ISBN
978-1-4244-2800-7
Type
conf
DOI
10.1109/ICIEA.2009.5138228
Filename
5138228
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