• DocumentCode
    2331017
  • Title

    Controlled slew rate enhancement circuit for error amplifier in high frequency DC-DC converters

  • Author

    Zhang, Chunming ; Shao, Zhibiao

  • Author_Institution
    Sch. of Electron. & Inf. Eng., Xi´´an Jiaotong Univ., Xi´´an
  • fYear
    2008
  • fDate
    Nov. 30 2008-Dec. 3 2008
  • Firstpage
    1852
  • Lastpage
    1855
  • Abstract
    Modern power applications are driving the demand for power supply systems with fast transient response. A novel controlled slew-rate enhancement (CSRE) circuit for error amplifier in high frequency DC-DC converters is proposed to improve transient responds of DC-DC converters under large load current changes. The CSRE circuit with embedded current-detection is connected in parallel with the error amplifier. By detecting the maximum difference current corresponding to the maximum derivation of the output voltage and optimizing sizes of the CSRE circuit, the CSRE circuit can be controlled properly so that the system stability can be guaranteed in various operating conditions. When the proposed circuits was employed in 100 MHz buck DC-DC converters implemented in SMIC 0.18 mum CMOS process, the simulation results of transient responses show that the CSRE circuit improves the average 1% settling time by 20 times and overshoot by 16 times, while the total quiescent power is only increased by less than 7.1.
  • Keywords
    CMOS integrated circuits; DC-DC power convertors; amplifiers; circuit stability; power supply circuits; transient response; SMIC CMOS process; buck DC-DC converter; controlled slew rate enhancement circuit; embedded current-detection; error amplifier; frequency 100 MHz; high frequency DC-DC converter; power supply system; size 0.18 mum; transient response; CMOS process; Circuit stability; Control systems; DC-DC power converters; Error correction; Frequency conversion; Power supplies; Size control; Transient response; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. APCCAS 2008. IEEE Asia Pacific Conference on
  • Conference_Location
    Macao
  • Print_ISBN
    978-1-4244-2341-5
  • Electronic_ISBN
    978-1-4244-2342-2
  • Type

    conf

  • DOI
    10.1109/APCCAS.2008.4746404
  • Filename
    4746404